Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits - researchr publication authors

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Lukas Chruszczyk, Jerzy Rutkowski. Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits. In 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008, St. Julien's, Malta, August 31 2008-September 3, 2008. pages 242-246, IEEE, 2008. [doi]

This author has not been identified. Look up 'Lukas Chruszczyk' in GoogleThis author has not been identified. Look up 'Jerzy Rutkowski' in Google

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