Lukas Chruszczyk, Jerzy Rutkowski. Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits. In 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008, St. Julien's, Malta, August 31 2008-September 3, 2008. pages 242-246, IEEE, 2008. [doi]
Abstract is missing.