Malgorzata Chrzanowska-Jeske, Rehman Ashraf, Rajeev K. Nain, Siva G. Narendra. Performance analysis of CNFET based circuits in the presence of fabrication imperfections. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 1363-1366, IEEE, 2012. [doi]
@inproceedings{Chrzanowska-JeskeANN12,
title = {Performance analysis of CNFET based circuits in the presence of fabrication imperfections},
author = {Malgorzata Chrzanowska-Jeske and Rehman Ashraf and Rajeev K. Nain and Siva G. Narendra},
year = {2012},
doi = {10.1109/ISCAS.2012.6271495},
url = {http://dx.doi.org/10.1109/ISCAS.2012.6271495},
researchr = {https://researchr.org/publication/Chrzanowska-JeskeANN12},
cites = {0},
citedby = {0},
pages = {1363-1366},
booktitle = {2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0218-0},
}