sat and 26.5% PAE in 16-nm FinFET CMOS - researchr publication authors

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Kun-Da Chu, Steven Callender, Yanjie Wang, Jacques Christophe Rudell, Stefano Pellerano, Christopher D. Hull. sat and 26.5% PAE in 16-nm FinFET CMOS. J. Solid-State Circuits, 56(5):1502-1513, 2021. [doi]

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