Yuan-Sheng Chu, Jen-Wei Hsieh, Yuan-Hao Chang, Tei-Wei Kuo. A set-based mapping strategy for flash-memory reliability enhancement. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 405-410, IEEE, 2009. [doi]
@inproceedings{ChuHCK09,
title = {A set-based mapping strategy for flash-memory reliability enhancement},
author = {Yuan-Sheng Chu and Jen-Wei Hsieh and Yuan-Hao Chang and Tei-Wei Kuo},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090697&count=326&index=83},
tags = {rule-based, reliability},
researchr = {https://researchr.org/publication/ChuHCK09},
cites = {0},
citedby = {0},
pages = {405-410},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}