Wen-Hsuan Chu, Yu-Jhe Li, Jing-Cheng Chang, Yu-Chiang Frank Wang. Spot and Learn: A Maximum-Entropy Patch Sampler for Few-Shot Image Classification. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 6251-6260, Computer Vision Foundation / IEEE, 2019. [doi]
Abstract is missing.