Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen. Covering hard-to-detect defects by thermal quorum sensing. In 23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018. pages 1-2, IEEE, 2018. [doi]
@inproceedings{ChuangWC18-0, title = {Covering hard-to-detect defects by thermal quorum sensing}, author = {Po-Yao Chuang and Cheng-Wen Wu and Harry H. Chen}, year = {2018}, doi = {10.1109/ETS.2018.8400705}, url = {https://doi.org/10.1109/ETS.2018.8400705}, researchr = {https://researchr.org/publication/ChuangWC18-0}, cites = {0}, citedby = {0}, pages = {1-2}, booktitle = {23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018}, publisher = {IEEE}, isbn = {978-1-5386-3728-9}, }