Table of Contents

• Challenges in Cell-Aware TestShreyas Pramod Dixit, Divyeshkumar Dhanjibhai Vora, Ke Peng. 1-6 [doi]
• On no-reference on-line error-tolerability testing for videosTong-Yu Hsieh, Shang-En Chan, Chi-Hsuan Ho. 1-2 [doi]
• On the mitigation of single event transients on flash-based FPGAsSarah Azimi, Boyang Du, Luca Sterpone. 1-2 [doi]
• Methodology for determining the influencing factors of lifetime variation for power devicesCiprian V. Pop, Andi Buzo, Georg Pelz, Horia Cucu, Corneliu Burileanu. 1-2 [doi]
• Sense amplifier offset characterisation and test implications for low-voltage SRAMs in 65 nmDhruv Patel, Derek Wright, Manoj Sachdev. 1-6 [doi]
• Covering undetected transition fault sites with optimistic unspecified transition faults under multicycle testsIrith Pomeranz. 1-2 [doi]
• Online prevention of security violations in reconfigurable scan networksAhmed Atteya, Michael A. Kochte, Matthias Sauer 0002, Pascal Raiola, Bernd Becker 0001, Hans-Joachim Wunderlich. 1-6 [doi]
• Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima. 1-2 [doi]
• Machine learning applications in IC testingHaralampos-G. D. Stratigopoulos. 1-10 [doi]
• ADC test methods using an impure stimulus: A surveyJan Schat. 1-5 [doi]
• BISTs for post-bond test and electrical analysis of high density 3D interconnect defectsImed Jani, Didier Lattard, Pascal Vivet, Lucile Arnaud, Edith Beigné. 1-6 [doi]
• Recycled IC detection through aging sensorDaniele Rossi 0001, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy. 1-2 [doi]
• Modeling and testing comparison faults of memristive ternary content addressable memoriesLi-Wei Deng, Jin-Fu Li, Yong-Xiao Chen. 1-6 [doi]
• Interconnect-aware tests to complement gate-exhaustive testsIrith Pomeranz, Srikanth Venkataraman. 1-6 [doi]
• Measuring mixed-signal test stimulus qualityKrzysztof Jurga, Stephen Sunter. 1-6 [doi]
• An efficient fault-tolerant valve-based microfluidic routing fabric for single-cell analysisYasamin Moradi, Krishnendu Chakrabarty, Ulf Schlichtmann. 1-2 [doi]
• ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checksSujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee. 1-2 [doi]
• A software reconfigurable assertion checking unit for run-time error detectionYumin Zhou, Sebastian Burg, Oliver Bringmann, Wolfgang Rosenstiel. 1-6 [doi]
• The impact of production defects on the soft-error tolerance of hardened latchesStefan Holst, Ruijun Ma, Xiaoqing Wen. 1-6 [doi]
• Design of fault-tolerant neuromorphic computing systemsMengyun Liu, Lixue Xia, Yu Wang, Krishnendu Chakrabarty. 1-9 [doi]
• Detection of IJTAG attacks using LDPC-based feature reduction and machine learningXuanle Ren, R. D. (Shawn) Blanton, Vítor Grade Tavares. 1-6 [doi]
• Automatic generation of in-circuit tests for board assembly defectsHarm van Schaaijk, Martien Spierings, Erik Jan Marinissen. 1-2 [doi]
• Design and testing methodologies for true random number generators towards industry certificationJosep Balasch, Florent Bernard, Viktor Fischer, Milos Grujic, Marek Laban, Oto Petura, Vladimir Rozic, Gerard van Battum, Ingrid Verbauwhede, Marnix Wakker, Bohan Yang 0001. 1-10 [doi]
• IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffersYu Li, Ming Shao, Hailong Jiao, Adam Cron, Sandeep Bhatia, Erik Jan Marinissen. 1-6 [doi]
• Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuitsFlorent Cilici, Manuel J. Barragan, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel. 1-6 [doi]
• Towards the formal verification of security properties of a Network-on-Chip routerJohanna Sepúlveda, Damian Aboul-Hassan, Georg Sigl, Bernd Becker 0001, Matthias Sauer 0002. 1-6 [doi]
• Locking of biochemical assays for digital microfluidic biochipsSukanta Bhattacharjee, Jack Tang, Mohamed Ibrahim, Krishnendu Chakrabarty, Ramesh Karri. 1-6 [doi]
• Covering hard-to-detect defects by thermal quorum sensingPo-Yao Chuang, Cheng-Wen Wu, Harry H. Chen. 1-2 [doi]
• Device aging: A reliability and security concernDaniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi. 1-10 [doi]
• Hardware Trojan detection using path delay order encoding with process variation toleranceXiaotong Cui, Kaijie Wu 0001, Ramesh Karri. 1-2 [doi]
• Model-based avionic systems testing for the airbus familyJan Peleska 0001. 1-10 [doi]
• Extending post-silicon coverage measurement using time-multiplexed FPGA overlaysFatemeh Eslami, Eddie Hung, Steven J. E. Wilton. 1-2 [doi]