Daniele Rossi 0001, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy. Recycled IC detection through aging sensor. In 23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018. pages 1-2, IEEE, 2018. [doi]
Abstract is missing.