Recycled IC detection through aging sensor

Daniele Rossi 0001, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy. Recycled IC detection through aging sensor. In 23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018. pages 1-2, IEEE, 2018. [doi]

Abstract

Abstract is missing.