Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee. ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. In 23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018. pages 1-2, IEEE, 2018. [doi]
Abstract is missing.