Interconnect-aware tests to complement gate-exhaustive tests

Irith Pomeranz, Srikanth Venkataraman. Interconnect-aware tests to complement gate-exhaustive tests. In 23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018. pages 1-6, IEEE, 2018. [doi]

Abstract

Abstract is missing.