Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima. Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262. In 23rd IEEE European Test Symposium, ETS 2018, Bremen, Germany, May 28 - June 1, 2018. pages 1-2, IEEE, 2018. [doi]
Abstract is missing.