A design for testability of non-volatile memory reliability test for automotive embedded processor

Chung Chuang, Chun-Yen Wu, Chi-Chun Hsu, Li-Ren Huang, Wei-Min Cheng, Wen-Dar Hsieh. A design for testability of non-volatile memory reliability test for automotive embedded processor. In 2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012, Kaohsiung, Taiwan, December 2-5, 2012. pages 372-375, IEEE, 2012. [doi]

Abstract

Abstract is missing.