Test challenges for deep sub-micron technologies

Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy. Test challenges for deep sub-micron technologies. In DAC. pages 142-149, 2000. [doi]

Authors

Kwang-Ting Cheng

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Sujit Dey

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Mike Rodgers

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Kaushik Roy

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