CPI reliability and EMI benefit for MIM CAP embedded C4 package

Hyunsuk Chun, In Hak Baick, Sangsu Ha, Eunmi Kwon, Seungbae Lee, Seil Kim, Sangwoo Pae, Jongwoo Park. CPI reliability and EMI benefit for MIM CAP embedded C4 package. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 5, IEEE, 2015. [doi]

Abstract

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