Luo Chun, Yang Jun, Gao Gugang, Shi Longxing. Domain fault model and coverage metric for SoC verification. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 5662-5665, IEEE, 2005. [doi]
@inproceedings{ChunJGL05,
title = {Domain fault model and coverage metric for SoC verification},
author = {Luo Chun and Yang Jun and Gao Gugang and Shi Longxing},
year = {2005},
doi = {10.1109/ISCAS.2005.1465922},
url = {http://dx.doi.org/10.1109/ISCAS.2005.1465922},
tags = {coverage},
researchr = {https://researchr.org/publication/ChunJGL05},
cites = {0},
citedby = {0},
pages = {5662-5665},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan},
publisher = {IEEE},
}