A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection - researchr publication authors

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Ji Hwan (Paul) Chun, Jae-Wook Lee, Jacob A. Abraham. A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection. In Proceedings of the 15th Asia South Pacific Design Automation Conference, ASP-DAC 2010, Taipei, Taiwan, January 18-21, 2010. pages 312-317, IEEE, 2010. [doi]

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