Jim Chung, N. Derhacobian, Jean Gasiot, Michael Nicolaidis, David Towne, R. Velazco. Soft Errors and Tolerance for Soft Errors. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 279-280, IEEE Computer Society, 2001. [doi]
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