Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo. Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 33-38, IEEE Computer Society, 2010. [doi]
@inproceedings{ChungPABW10,
title = {Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate},
author = {Jaeyong Chung and Joonsung Park and Jacob A. Abraham and Eonjo Byun and Cheol-Jong Woo},
year = {2010},
doi = {10.1109/VTS.2010.5469625},
url = {http://dx.doi.org/10.1109/VTS.2010.5469625},
tags = {testing},
researchr = {https://researchr.org/publication/ChungPABW10},
cites = {0},
citedby = {0},
pages = {33-38},
booktitle = {28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-6648-1},
}