Wei-Ho Chung, Mu-En Wu, Yeong-Luh Ueng, Yi-Hsuan Su. Forged Seal Imprint Identification Based on Regression Analysis on Imprint Borders and Metrics Comparisons. In IEEE Conference on Dependable and Secure Computing, DSC 2018, Kaohsiung, Taiwan, December 10-13, 2018. pages 1-5, IEEE, 2018. [doi]
@inproceedings{ChungWUS18,
title = {Forged Seal Imprint Identification Based on Regression Analysis on Imprint Borders and Metrics Comparisons},
author = {Wei-Ho Chung and Mu-En Wu and Yeong-Luh Ueng and Yi-Hsuan Su},
year = {2018},
doi = {10.1109/DESEC.2018.8625152},
url = {https://doi.org/10.1109/DESEC.2018.8625152},
researchr = {https://researchr.org/publication/ChungWUS18},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE Conference on Dependable and Secure Computing, DSC 2018, Kaohsiung, Taiwan, December 10-13, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5790-4},
}