Wei-Ho Chung, Mu-En Wu, Yeong-Luh Ueng, Yi-Hsuan Su. Forged Seal Imprint Identification Based on Regression Analysis on Imprint Borders and Metrics Comparisons. In IEEE Conference on Dependable and Secure Computing, DSC 2018, Kaohsiung, Taiwan, December 10-13, 2018. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.