Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham. Testability-Driven Statistical Path Selection. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(8):1275-1287, 2012. [doi]
@article{ChungXZA12a,
title = {Testability-Driven Statistical Path Selection},
author = {Jaeyong Chung and Jinjun Xiong and Vladimir Zolotov and Jacob A. Abraham},
year = {2012},
doi = {10.1109/TCAD.2012.2190067},
url = {http://dx.doi.org/10.1109/TCAD.2012.2190067},
researchr = {https://researchr.org/publication/ChungXZA12a},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {31},
number = {8},
pages = {1275-1287},
}