Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner. Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation. Microelectronics Reliability, 49(9-11):972-976, 2009. [doi]
@article{CiappaMSOF09,
title = {Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation},
author = {Mauro Ciappa and Luigi Mangiacapra and Maria Stangoni and Stephan Ott and Wolfgang Fichtner},
year = {2009},
doi = {10.1016/j.microrel.2009.07.035},
url = {http://dx.doi.org/10.1016/j.microrel.2009.07.035},
tags = {optimization, reliability},
researchr = {https://researchr.org/publication/CiappaMSOF09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {972-976},
}