Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources

Mauro Ciappa, Ying Pang, Chenchen Sun. Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources. Microelectronics Reliability, 88:476-481, 2018. [doi]

Authors

Mauro Ciappa

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Ying Pang

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Chenchen Sun

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