Temperature controlled oven for low noise measurement systems [for electromigration characterization]

Carmine Ciofi, Ivan Ciofi, Stefano C. Di Pascoli, Bruno Neri. Temperature controlled oven for low noise measurement systems [for electromigration characterization]. IEEE T. Instrumentation and Measurement, 49(3):546-549, 2000. [doi]

Authors

Carmine Ciofi

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Ivan Ciofi

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Stefano C. Di Pascoli

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Bruno Neri

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