Temperature controlled oven for low noise measurement systems [for electromigration characterization]

Carmine Ciofi, Ivan Ciofi, Stefano C. Di Pascoli, Bruno Neri. Temperature controlled oven for low noise measurement systems [for electromigration characterization]. IEEE T. Instrumentation and Measurement, 49(3):546-549, 2000. [doi]

@article{CiofiCPN00,
  title = {Temperature controlled oven for low noise measurement systems [for electromigration characterization]},
  author = {Carmine Ciofi and Ivan Ciofi and Stefano C. Di Pascoli and Bruno Neri},
  year = {2000},
  doi = {10.1109/19.850392},
  url = {http://dx.doi.org/10.1109/19.850392},
  researchr = {https://researchr.org/publication/CiofiCPN00},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {49},
  number = {3},
  pages = {546-549},
}