NoC monitoring: impact on the design flow

Calin Ciordas, Kees Goossens, Andrei Radulescu, Twan Basten. NoC monitoring: impact on the design flow. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

Abstract

Abstract is missing.