Vladimir Ciric, Vladimir Simic, Ivan Milentijevic. Yield Modeling for Error Tolerant and Partially Defect Tolerant Arrays. In Miroslav Popovic, Bernhard Schätz, Sebastian Voss, editors, IEEE 19th International Conference and Workshops on Engineering of Computer-Based Systems, ECBS 2012, Novi Sad, Serbia, April 11-13, 2012. pages 182-187, IEEE, 2012. [doi]
Abstract is missing.