Bistatic Analysis Using the Real Representation Scattering Matrix Eigen-Classification

Madalina Ciuca, Gabriel Vasile, Andrei Anghel, Michel Gay, Silviu Ciochina. Bistatic Analysis Using the Real Representation Scattering Matrix Eigen-Classification. IEEE T. Geoscience and Remote Sensing, 60:1-18, 2022. [doi]

Abstract

Abstract is missing.