Improving architecture testability with patterns

Roberta Coelho, Uirá Kulesza, Arndt von Staa. Improving architecture testability with patterns. In Ralph E. Johnson, Richard P. Gabriel, editors, Companion to the 20th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2005, October 16-20, 2005, San Diego, CA, USA. pages 114-115, ACM, 2005. [doi]

Authors

Roberta Coelho

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Uirá Kulesza

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Arndt von Staa

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