Roberta Coelho, Uirá Kulesza, Arndt von Staa. Improving architecture testability with patterns. In Ralph E. Johnson, Richard P. Gabriel, editors, Companion to the 20th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2005, October 16-20, 2005, San Diego, CA, USA. pages 114-115, ACM, 2005. [doi]
@inproceedings{CoelhoKS05,
title = {Improving architecture testability with patterns},
author = {Roberta Coelho and Uirá Kulesza and Arndt von Staa},
year = {2005},
doi = {10.1145/1094855.1094890},
url = {http://doi.acm.org/10.1145/1094855.1094890},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/CoelhoKS05},
cites = {0},
citedby = {0},
pages = {114-115},
booktitle = {Companion to the 20th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2005, October 16-20, 2005, San Diego, CA, USA},
editor = {Ralph E. Johnson and Richard P. Gabriel},
publisher = {ACM},
isbn = {1-59593-193-7},
}