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Planar and Minor-Free Metrics Embed into Metrics of Polylogarithmic Treewidth with Expected Multiplicative Distortion Arbitrarily Close to 1

Vincent Cohen-Addad, Hung Le, Marcin Pilipczuk, Michal Pilipczuk. Planar and Minor-Free Metrics Embed into Metrics of Polylogarithmic Treewidth with Expected Multiplicative Distortion Arbitrarily Close to 1. In 64th IEEE Annual Symposium on Foundations of Computer Science, FOCS 2023, Santa Cruz, CA, USA, November 6-9, 2023. pages 2262-2277, IEEE, 2023. [doi]

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