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Time-Frequency Analysis of a Variable Stiffness Model for Fault Development

Leon Cohen, Lorenzo Galleani, Robert Hedges, David Hughes, Patrick Loughlin, Bruce Suter. Time-Frequency Analysis of a Variable Stiffness Model for Fault Development. Digital Signal Processing, 12(2-3):429-440, 2002. [doi]

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Leon Cohen

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Lorenzo Galleani

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Robert Hedges

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David Hughes

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Patrick Loughlin

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Bruce Suter

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