Time-Frequency Analysis of a Variable Stiffness Model for Fault Development

Leon Cohen, Lorenzo Galleani, Robert Hedges, David Hughes, Patrick Loughlin, Bruce Suter. Time-Frequency Analysis of a Variable Stiffness Model for Fault Development. Digital Signal Processing, 12(2-3):429-440, 2002. [doi]

@article{CohenGHHLS02,
  title = {Time-Frequency Analysis of a Variable Stiffness Model for Fault Development},
  author = {Leon Cohen and Lorenzo Galleani and Robert Hedges and David Hughes and Patrick Loughlin and Bruce Suter},
  year = {2002},
  doi = {10.1006/dspr.2002.0458},
  url = {http://dx.doi.org/10.1006/dspr.2002.0458},
  tags = {meta-model, analysis, model-driven development, Meta-Environment},
  researchr = {https://researchr.org/publication/CohenGHHLS02},
  cites = {0},
  citedby = {0},
  journal = {Digital Signal Processing},
  volume = {12},
  number = {2-3},
  pages = {429-440},
}