Edith Cohen, Haim Kaplan. Bottom-k sketches: better and more efficient estimation of aggregates. In Leana Golubchik, Mostafa H. Ammar, Mor Harchol-Balter, editors, Proceedings of the 2007 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2007, San Diego, California, USA, June 12-16, 2007. pages 353-354, ACM, 2007. [doi]
@inproceedings{CohenK07:3,
title = {Bottom-k sketches: better and more efficient estimation of aggregates},
author = {Edith Cohen and Haim Kaplan},
year = {2007},
doi = {10.1145/1254882.1254926},
url = {http://doi.acm.org/10.1145/1254882.1254926},
researchr = {https://researchr.org/publication/CohenK07%3A3},
cites = {0},
citedby = {0},
pages = {353-354},
booktitle = {Proceedings of the 2007 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2007, San Diego, California, USA, June 12-16, 2007},
editor = {Leana Golubchik and Mostafa H. Ammar and Mor Harchol-Balter},
publisher = {ACM},
isbn = {978-1-59593-639-4},
}