Edith Cohen, Haim Kaplan. Bottom-k sketches: better and more efficient estimation of aggregates. In Leana Golubchik, Mostafa H. Ammar, Mor Harchol-Balter, editors, Proceedings of the 2007 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2007, San Diego, California, USA, June 12-16, 2007. pages 353-354, ACM, 2007. [doi]
Abstract is missing.