Read disturb on flash memories: Study on temperature annealing effect

L. Cola, M. De Tomasi, R. Enrici Vaion, A. Mervic, P. Zabberoni. Read disturb on flash memories: Study on temperature annealing effect. Microelectronics Reliability, 52(9-10):1803-1807, 2012. [doi]

Abstract

Abstract is missing.