Stress Testing for Resilience of Semiconductor Supply Chains - researchr publication authors

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Zachary A. Collier, Davis C. Loose, Elvie Sellers, Thomas L. Polmateer, Madhur Behl, Igor Linkov, James H. Lambert. Stress Testing for Resilience of Semiconductor Supply Chains. In Satyajit Chakrabarti, Rajashree Paul, editors, 14th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2023, New York, NY, USA, October 12-14, 2023. pages 42-49, IEEE, 2023. [doi]

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