Zachary A. Collier, Davis C. Loose, Elvie Sellers, Thomas L. Polmateer, Madhur Behl, Igor Linkov, James H. Lambert. Stress Testing for Resilience of Semiconductor Supply Chains. In Satyajit Chakrabarti, Rajashree Paul, editors, 14th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2023, New York, NY, USA, October 12-14, 2023. pages 42-49, IEEE, 2023. [doi]
@inproceedings{CollierLSPBLL23,
title = {Stress Testing for Resilience of Semiconductor Supply Chains},
author = {Zachary A. Collier and Davis C. Loose and Elvie Sellers and Thomas L. Polmateer and Madhur Behl and Igor Linkov and James H. Lambert},
year = {2023},
doi = {10.1109/UEMCON59035.2023.10315988},
url = {https://doi.org/10.1109/UEMCON59035.2023.10315988},
researchr = {https://researchr.org/publication/CollierLSPBLL23},
cites = {0},
citedby = {0},
pages = {42-49},
booktitle = {14th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2023, New York, NY, USA, October 12-14, 2023},
editor = {Satyajit Chakrabarti and Rajashree Paul},
publisher = {IEEE},
isbn = {979-8-3503-0413-8},
}