Assessing Distortion Within the IEC Framework in the Presence of High Frequency Components: Some Considerations on Signal Processing

Adam J. Collin, Roberto Langella, Alfredo Testa, Sasa Z. Djokic, Jiri Drapela. Assessing Distortion Within the IEC Framework in the Presence of High Frequency Components: Some Considerations on Signal Processing. In 9th IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2018, Bologna, Italy, September 26-28, 2018. pages 1-6, IEEE, 2018. [doi]

Abstract

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