Carlo Colombo, Dario Comanducci, Alberto Del Bimbo, Federico Pernici. Accurate Automatic Localization of Surfaces of Revolution for Self-Calibration and Metric Reconstruction. In IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2004, Washington, DC, USA, June 27 - July 2, 2004. pages 55, IEEE, 2004. [doi]
Abstract is missing.