Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso. Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectronics Reliability, 53(9-11):1809-1813, 2013. [doi]
@article{CompagninMBGCVMZM13,
title = {Thermal and electrical investigation of the reverse bias degradation of silicon solar cells},
author = {Alessandro Compagnin and Matteo Meneghini and Marco Barbato and Valentina Giliberto and Andrea Cester and Massimo Vanzi and Giovanna Mura and Enrico Zanoni and Gaudenzio Meneghesso},
year = {2013},
doi = {10.1016/j.microrel.2013.07.013},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.013},
researchr = {https://researchr.org/publication/CompagninMBGCVMZM13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1809-1813},
}