Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso. Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectronics Reliability, 53(9-11):1809-1813, 2013. [doi]
Abstract is missing.