Joan P. Company-Corcoles, Emilio Garcia-Fidalgo, Alberto Ortiz. Towards Robust Loop Closure Detection in Weakly Textured Environments using Points and Lines. In 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020. pages 1313-1316, IEEE, 2020. [doi]
@inproceedings{Company-Corcoles20,
title = {Towards Robust Loop Closure Detection in Weakly Textured Environments using Points and Lines},
author = {Joan P. Company-Corcoles and Emilio Garcia-Fidalgo and Alberto Ortiz},
year = {2020},
doi = {10.1109/ETFA46521.2020.9212133},
url = {https://doi.org/10.1109/ETFA46521.2020.9212133},
researchr = {https://researchr.org/publication/Company-Corcoles20},
cites = {0},
citedby = {0},
pages = {1313-1316},
booktitle = {25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8956-7},
}