Conformer and Blind Noisy Students for Improved Image Quality Assessment

Marcos V. Conde, Maxime Burchi, Radu Timofte. Conformer and Blind Noisy Students for Improved Image Quality Assessment. In IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2022, New Orleans, LA, USA, June 19-20, 2022. pages 939-949, IEEE, 2022. [doi]

Abstract

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