Efficient bit-channel reliability computation for multi-mode polar code encoders and decoders

Carlo Condo, Seyyed Ali Hashemi, Warren J. Gross. Efficient bit-channel reliability computation for multi-mode polar code encoders and decoders. In 2017 IEEE International Workshop on Signal Processing Systems, SiPS 2017, Lorient, France, October 3-5, 2017. pages 1-6, IEEE, 2017. [doi]

Abstract

Abstract is missing.