Analysis of Modularity by an Aspect-Oriented Measurement Process

José María Conejero, Juan Hernández, Elena Jurado, Klaas van den Berg. Analysis of Modularity by an Aspect-Oriented Measurement Process. In Ana Moreira, María José Suárez Cabal, Claudio de la Riva, Javier Tuya, editors, XIII Jornadas de Ingeniería del Software y Bases de Datos (JISBD 2008), Gijón, Spain, October 7-10, 2008. Proceedings. pages 3-14, 2008.

@inproceedings{ConejeroHJB08,
  title = {Analysis of Modularity by an Aspect-Oriented Measurement Process},
  author = {José María Conejero and Juan Hernández and Elena Jurado and Klaas van den Berg},
  year = {2008},
  researchr = {https://researchr.org/publication/ConejeroHJB08},
  cites = {0},
  citedby = {0},
  pages = {3-14},
  booktitle = {XIII Jornadas de Ingeniería del Software y Bases de Datos (JISBD 2008), Gijón, Spain, October 7-10, 2008. Proceedings},
  editor = {Ana Moreira and María José Suárez Cabal and Claudio de la Riva and Javier Tuya},
}