A practical perspective on reducing ASIC NTFs

Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow. A practical perspective on reducing ASIC NTFs. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 7, IEEE, 2005. [doi]

@inproceedings{ConroyRGE05,
  title = {A practical perspective on reducing ASIC NTFs},
  author = {Zoe Conroy and Geoff Richmond and Xinli Gu and Bill Eklow},
  year = {2005},
  doi = {10.1109/TEST.2005.1583992},
  url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583992},
  researchr = {https://researchr.org/publication/ConroyRGE05},
  cites = {0},
  citedby = {0},
  pages = {7},
  booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
  publisher = {IEEE},
  isbn = {0-7803-9038-5},
}