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Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction

H. Conseil-Gudla, Z. Staliulionis, Sankhya Mohanty, Morten Stendahl Jellesen, Jesper Henri Hattel, Rajan Ambat. Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction. Microelectronics Reliability, 82:136-146, 2018. [doi]

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