Toward Gated-Diode-BIMOS for thin silicon ESD protection in advanced FD-SOI CMOS technologies - researchr publication authors

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Louise De Conti, Thomas Bedecarrats, Maud Vinet, Sorin Cristoloveanu, Philippe Galy. Toward Gated-Diode-BIMOS for thin silicon ESD protection in advanced FD-SOI CMOS technologies. In 2017 IEEE International Conference on IC Design and Technology, ICICDT 2017, Austin, TX, USA, May 23-25, 2017. pages 1-4, IEEE, 2017. [doi]

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